High-energy characterization of multilayers for hard x-ray astronomy

被引:1
|
作者
Ivan, A [1 ]
Bruni, RJ [1 ]
Cenko, SB [1 ]
Gorenstein, P [1 ]
Romaine, SE [1 ]
机构
[1] MIT, Cambridge, MA 02138 USA
关键词
x-ray multilayers; hard x-ray telescopes; high energy x-ray reflectivity;
D O I
10.1117/12.454366
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We report the results obtained during the second phase of a program which consists of comparing the performance of different multilayer material combinations. These coatings will be used to extend the bandpass of current hard X-ray optics toward 100 keV, an order of magnitude higher than present technology. The materials studied here are W/Si, Pt/C, and W/C. A comparison of the performance of depth graded multilayers of these different materials at energies 30-80 keV was undertaken. Specular reflectivity data were acquired at 30-80 keV using the X17B1 beamline of the National Synchrotron Light Source. Reflectivity versus energy plots showed a high enough reflectivity for the bandpass of interest at grazing angles typical for hard x-ray telescope mirror shells. The next phase of our pro-ram will continue with similar high-energy pencil beam measurements on multilayer coated telescope prototype shells.
引用
收藏
页码:134 / 139
页数:6
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