Raman scattering analysis of high-T-c superconductors

被引：0
|
作者：
Thomsen, C
机构：
来源：
JOURNAL OF RAMAN SPECTROSCOPY | 1996年 / 27卷 / 3-4期
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中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
High-T-c superconductors have been under investigation by Raman scattering both from interest in their fundamental properties and from the point of view of characterizing them for potential applications. Some of the more recent aspects of characterizing YBa2Cu3O7-delta thin films for potential device application are discussed.
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页码：329 / 332
页数：4
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