Back-Projection Cortical Potential Imaging: A Sensitivity Study

被引:0
|
作者
Haor, Dror [1 ,2 ]
Shavit, Reuven [1 ]
Peremen, Ziv [2 ]
Stern, Yaki [2 ]
Geva, Amir [1 ,2 ]
机构
[1] Ben Gurion Univ Negev, Dept Elect & Comp Engn, Beer Sheva, Israel
[2] ElMindA Ltd, Herzliyya, Israel
关键词
Cortical potential imaging; back-projection; inverse problem; surface Laplacian; simulative validation;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work we inspect and validate the back-projection cortical potential imaging (BP-CPI) technique. The BP-CPI is a relatively new tool which estimates highly detailed cortical potential distributions from the smeared measured EEG spatial signals. The testing of this tool includes the study of the BP-CPI sensitivity to real-life interferences and errors, such as electrodes noise, displacement errors, and the number of electrodes. This was done through a series of computer simulations (performed using Sim4Life by ZMT) solving scalp and cortical potential distributions excited by three source configurations. Examining the results in this sensitivity study, it is clear that the BP-CPI technique provides a useful tool for recovering the cortical potential underlying within the subject head.
引用
收藏
页码:301 / 305
页数:5
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