Electrical-Thermal Co-Simulation for Analysis of High-Power RF/Microwave Components

被引:45
|
作者
Lu, Tianjian [1 ]
Jin, Jian-Ming [1 ]
机构
[1] Univ Illinois, Dept Elect & Comp Engn, Ctr Computat Electromagnet, Urbana, IL 61801 USA
关键词
Domain decomposition; electrical-thermal co-simulation; finite element method (FEM); substrate integrated waveguide (SIW); temperature stability; COMPUTATIONAL ELECTROMAGNETICS CEM; SELECTIVE VALIDATION FSV; INTERCONNECTS; CIRCUITS;
D O I
10.1109/TEMC.2016.2597311
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An electrical-thermal co-simulation based on the finite element method is presented for analysis of high-power RF/microwave circuits. The co-simulation integrates a full-wave electromagnetic analysis and a transient thermal analysis through an iterative scheme, and is devised for the design and analysis of RF/microwave circuits operated at high frequencies and high power levels. To enhance the efficiency in solving large-scale problems, a domain decomposition scheme called the finite element tearing and interconnecting and an adaptive time-stepping scheme based on the algorithm of proportional-integral-derivative control are incorporated into the co-simulation. Temperature stability analysis is performed with the proposed co-simulation for a matching network in high-power RF amplifiers and for a substrate integrated waveguide filter.
引用
收藏
页码:93 / 102
页数:10
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