N-Polar GaN Cap MISHEMT With Record Power Density Exceeding 6.5 W/mm at 94 GHz

被引:93
|
作者
Wienecke, Steven [1 ]
Romanczyk, Brian [1 ]
Guidry, Matthew [1 ]
Li, Haoran [1 ]
Ahmadi, Elaheh [1 ]
Hestroffer, Karine [1 ]
Zheng, Xun [1 ]
Keller, Stacia [1 ]
Mishra, Umesh K. [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
关键词
GaN; high-electron-mobility-transistor (HEMT); millimeter (mm) wave; N-Polar; power amplifier; W-band; ELECTRON-MOBILITY TRANSISTORS;
D O I
10.1109/LED.2017.2653192
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel N-Polar GaN cap (MIS) high electron mobility transistor demonstrating record 6.7-W/mm power density with an associated power-added efficiency of 14.4% at 94 GHz is presented. This state-of-the-art power performance is enabled by utilizing the inherent polarization fields of N-Polar GaN in combination with a 47.5-nm in situ GaN cap layer to simultaneously mitigate dispersion and improve access region conductivity. These excellent results build upon past work through the use of optimized device dimensions and a transition from a sapphire to a SiC substrate for reduced self-heating.
引用
收藏
页码:359 / 362
页数:4
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