Output-based Adaptive Iterative Learning Control of Uncertain Linear Systems Applied to a Wafer Stage

被引:2
|
作者
Cao, Mingsheng [1 ,2 ]
Bo, Yumeng [1 ]
Gao, Huibin [1 ]
机构
[1] Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, 88 Yingkou Rd, Changchun, Peoples R China
[2] Univ Chinese Acad Sci, Beijing, Peoples R China
关键词
Iterative estimation; iterative learning control; time-iteration-varying disturbance; wafer stage; DESIGN;
D O I
10.1007/s12555-020-0564-9
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Iterative learning control (ILC) is an efficient technique applicable to improving the tracking performance of systems that have a repetitive nature. In this paper, point-to-point movements with time-iteration-varying disturbances are considered instead. A new output-based adaptive ILC scheme consisting of an adaptive second-order ILC and an iterative learning estimation of time-iteration-varying disturbances is proposed for a class of linear systems with unknown parameters. The proposed algorithm is used to improve trajectory tracking performance without requiring a plant model or a sensitivity function, and without assuming the initial condition to be zero. In order to verify the proposed algorithm, it is applied to a wafer stage, and the obtained tracking performance is compared with that obtained using a traditional second-order ILC algorithm; better results are obtained using the proposed method.
引用
收藏
页码:741 / 749
页数:9
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