A submicronic beam size monitor for the final focus test beam

被引：0
|
作者：
Puzo, P
Buon, J
Jeanjean, J
LeDiberder, F
Lepeltier, V
机构：
来源：
BEAM INSTRUMENTATION - PROCEEDINGS OF THE SEVENTH WORKSHOP | 1997年 / 390期
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O59 [应用物理学];
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摘要：
A gas-ionization beam size monitor has been used to optimize and measure the transverse electron beam dimensions of the Final Focus Test Beam at SLAC. The ultimate values measured with the monitor are 1.5 mu m x 70 nm. Moreover, the high sensitivity of the monitor has been used to detect and cancel detrimental 'banana' shapes of the beam.
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页码：273 / 280
页数：8
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