A Novel Pattern Run-Length Coding Method for Test Data Compression

被引：2

作者：

Wu, Diancheng ^{[1
]}

Liu, Yu ^{[1
]}

Zhu, Hao ^{[1
]}

Wang, Donghui ^{[1
]}

Hao, Chengpeng ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Acoust, Beijing 100190, Peoples R China

来源：

IEICE TRANSACTIONS ON ELECTRONICS | 2013年 / E96C卷 / 09期

关键词：

Automatic Test Equipment; test data compression; pattern run-length coding; X-assigning;

D O I：

10.1587/transele.E96.C.1201

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a novel data compression method for testing integrated circuits within the framework of pattern run-length coding. The test set is firstly divided into 2(n)-length patterns where n is a natural number. Then the compatibility of each pattern, which can be an external type, or an internal type, is analyzed. At last, the codeword of each pattern is generated according to its analysis result. Experimental results for large ISCAS89 benchmarks show that the proposed method can obtain a higher compression ratio than existing ones.

引用

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页码：1201 / 1204

页数：4

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