Physics of electronic transport in low-dimensionality materials for future FETs

被引:0
|
作者
Fischetti, M. V. [1 ]
Vandenberghe, W. G. [1 ]
Fu, Bo [1 ]
Narayanan, S. [1 ]
Kim, J. [1 ]
Ong, Z. -Y. [1 ]
Suarez-Negreira, A. [1 ]
Sachs, C. [1 ]
Aboud, S. J. [2 ]
机构
[1] Univ Texas Dallas, Dept Mat Sci & Engn, Richardson, TX 75080 USA
[2] Stanford Univ, Energy Resources Engn, Stanford, CA 95306 USA
关键词
EFFECT TRANSISTOR BISFET;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We show that scaling rules, quantum confinement in thin bodies, and the resulting gate leakage render imperative the use of low-dimensionality materials as channels in devices scaled beyond the 10 nm gate length. We then consider a few examples of two-dimensional materials of great interest, graphene and bilayer graphene, and show how the dielectric environment (gate and interlayer insulators, nearby gates) has a dramatically strong effect on the electronic properties of systems such as supported graphene, nanoribbons, and graphene bilayers in which a Bose-Einstein exciton condensation has been predicted to occur at high temperature. Finally, we consider the novel concept of devices based on monolayer tin ('stannanane') as a topological insulator.
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页码:1 / 4
页数:4
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