Surface plasmon resonance sensor based on polarization interferometry and angle modulation

被引：19
|
作者：
Sun, ZL [1 ]
He, YH [1 ]
Guo, JH [1 ]
机构：
[1] Tsing Hua Univ, Grad Sch, Lab Opt Imaging & Sensing, Shenzhen 518055, Peoples R China
来源：
APPLIED OPTICS | 2006年 / 45卷 / 13期
关键词：
D O I：
10.1364/AO.45.003071
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A surface plasmon resonance (SPR) sensing technique based on polarization interferometry and angle modulation is presented. Its sensitivity is not a direct function of variation of reflection intensity, nor of phase shift. Rather, it is a function of the complex reflection coefficient. A three times standard deviation detection limit of 5.1 X 10(-7) refractive index units in a 2 Hz bandwidth is obtained with our experimental setup. A theoretical analysis shows that this technique can provide a wide linear measurement range. Moreover, the sensitivity is insensitive to the thickness of gold films over approximately 5 nm. This SPR sensing technique is suitable for physical, chemical, and biological research. (c) 2006 Optical Society of America.
引用
收藏
页码：3071 / 3076
页数：6
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