Non-Volatile Memory versus Big Data

被引：0
|
作者：
Kuo, Tei-Wei [1 ]
机构：
[1] Acad Sinica, Taipei, Taiwan
来源：
2016 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT) | 2016年
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中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
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页数：1
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