BSIM-IMG: A Turnkey Compact Model for Fully Depleted Technologies

被引：0
|
作者：
Hu, Chenming
Niknejad, Ali
机构：
来源：
IEEE INTERNATIONAL SOI CONFERENCE | 2012年
关键词：
SOI MOSFETS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页数：24
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