Electrical characteristics of GaAs nanocrystalline thin film

被引:4
|
作者
Nayak, J [1 ]
Sahu, SN [1 ]
机构
[1] Inst Phys, Condensed Matter Phys Expt, Bhubaneswar 751005, Orissa, India
关键词
nanocrystalline; transmission electron micrograph;
D O I
10.1016/j.sse.2005.12.011
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
GaAs nanocrystalline thin films containing 7-15 nm size crystallites were synthesized by an electrodeposition technique. A thin surface Ga2O3 layer was detected due to atmospheric oxidation of the GaAs nanocrystals. The above films were electrically characterized by the capacitance-voltage studies of the Au/nano-GaAs Schottky junctions. The effect of the nanostructure was fairly realized in the capacitance-voltage characteristics by the observation of capacitance peaks arising due to the trapping of the charge carriers by the surface states. The capacitance-voltage characteristics were recorded both at low and high frequencies of the impressed ac signal in order to identify the effect of the surface states on the behavior of the capacitance of the device. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:164 / 169
页数:6
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