CHARACTERIZATION OF INDENTATION INDUCED MARTENSITIC TRANSFORMATION BY SCANNING ELECTRON MICROSCOPY AND ELECTRON BACK-SCATTERED DIFFRACTION

P. Hausild(a) and J. Nohava(b) ((a)Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague, Czech Republic, (CSM)-C-b Instruments, Switzerland): Characterization of Indentation Induced Martensitic Transformation by Scanning Electron Microscopy and Electron Back-Scattered Diffraction Local analysis of martensite transformed in the vicinity of the spherical indents was carried out by light and scanning electron microscopy, 3D stereopair reconstruction and electron back-scattered diffraction. Multiaxial stress-strain field under the indent has a significant effect on the orientation of the martensite variants. Combining nanoindentation with scanning techniques such as SEM and EBSD brings more insight into the whole indentation process.