共 50 条
- [41] Automatic defect severity scoring for 193 nm reticle defect inspection [J]. OPTICAL MICROLITHOGRAPHY XIV, PTS 1 AND 2, 2001, 4346 : 898 - 906
- [42] Classifier design of on-line surface defect inspection system for plates [J]. Kang T'ieh, 2006, 4 (47-50):
- [43] The PCB Defect Inspection System Design Based on Lab Windows/CVI [J]. 2009 INTERNATIONAL CONFERENCE ON INDUSTRIAL MECHATRONICS AND AUTOMATION, 2009, : 485 - +
- [44] Aperture design for a dark-field wafer defect inspection system [J]. APPLIED OPTICS, 2021, 60 (35) : 10830 - 10837
- [46] Automatic inspection of woven fabric density of solid colour fabric density by the hough transform [J]. Fibres and Textiles in Eastern Europe, 2010, 81 (04): : 46 - 51
- [48] Novel proposed technique for automatic fabric defect detection [J]. MULTIMEDIA TOOLS AND APPLICATIONS, 2023, 82 (20) : 30783 - 30806
- [49] Novel proposed technique for automatic fabric defect detection [J]. Multimedia Tools and Applications, 2023, 82 : 30783 - 30806
- [50] Integration of Computer-Aided Design (CAD) Information into a Defect -Review SEM Platform and Design Based Automatic Defect Classification DI: Defect Inspection and Reduction [J]. 2019 30TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2019,