Energy values of very low-energy ion beams

被引:0
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作者
Sakudo, N
Hayashi, K
Yukishiro, Y
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ion beams of energy levels less than 100 eV are used to form special films with excellent physical and chemical properties. However, their energy values are inaccurate unless the plasma potentials are taken into account with their total energies. For simple plasmas which consist of singly-charged ions of a single species and electrons of a single electron temperature, we have formerly reported how to get the accurate values. In this paper, we further investigate the exact energy values for a source plasma having double electron temperatures as is often the case with industrially used ion sources.
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页码:327 / 330
页数:4
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