Optical reflectivity study of silicon ion implanted poly(methyl methacrylate)

被引：20
|
作者：
Hadjichristov, Georgi B. [1 ]
Stefanov, Ivan L. [2 ]
Florian, Bojana I. [3 ]
Blaskova, Gergana D. [3 ]
Ivanov, Victor G.
Faulques, Eric [4 ]
机构：
[1] Bulgarian Acad Sci, Georgi Nadjakov Inst Solid State Phys, BG-1784 Sofia, Bulgaria
[2] Univ Sofia, Fac Phys, Dept Quantum Elect, BG-1164 Sofia, Bulgaria
[3] Natl Meteorol Ctr, Bulgarian Inst Metrol, BG-1797 Sofia, Bulgaria
[4] Nantes Atlantic Univ, CNRS, Inst Mat Jean Rouxel, UMR6502, F-44322 Nantes, France
来源：
APPLIED SURFACE SCIENCE | 2009年 / 256卷 / 03期
关键词：
Ion implanted polymers; Optical properties; Diffuse reflectivity; Specular reflectivity; Poly(methyl methacrylate) (PMMA); Materials science; BEAM-INDUCED CHANGES; WAVE-GUIDES; REFRACTIVE-INDEX; PMMA; POLYMETHYLMETHACRYLATE; CARBON; LIGHT;
D O I：
10.1016/j.apsusc.2009.08.059
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The optical reflectivity (both specular and off-specular) of poly(methyl methacrylate) (PMMA) implanted with silicon ions (Si+) at energy of 50 keV, is studied in the spectral range 0.25-25 mu m. The effect from the Si+ implantation on the reflectivity of two PMMA materials is examined in the dose range from 10(14) to 10(17) ions/cm(2) and is linked to the structure formed in this ion implanted plastic. As compared to the pristine PMMA, an enhancement of the reflectivity of Si+ implanted PMMA is observed, that is attributed to the modi. cation of the subsurface region of PMMA upon the ion implantation. The ion-produced subsurface organic interface is also probed by laser-induced thermo-lens. (C) 2009 Elsevier B. V. All rights reserved.
引用
收藏
页码：779 / 786
页数：8
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