Low-Temperature Growth of Graphene on a Semiconductor

被引:7
|
作者
Rost, Hakon, I [1 ]
Chellappan, Rajesh Kumar [1 ]
Strand, Frode S. [1 ]
Grubisic-Cabo, Antonija [2 ]
Reed, Benjamen P. [3 ]
Prieto, Mauricio J. [4 ]
Tanase, Liviu C. [4 ]
Caldas, Lucas de Souza [4 ]
Wongpinij, Thipusa [5 ]
Euaruksakul, Chanan [5 ]
Schmidt, Thomas [4 ]
Tadich, Anton [6 ]
Cowie, Bruce C. C. [6 ]
Li, Zheshen [7 ]
Cooil, Simon P. [3 ,8 ]
Wells, Justin W. [1 ]
机构
[1] Norwegian Univ Sci & Technol NTNU, Ctr Quantum Spintron, Dept Phys, NO-7491 Trondheim, Norway
[2] Monash Univ, Sch Phys & Astron, Clayton, Vic 3168, Australia
[3] Aberystwyth Univ, Dept Phys, Aberystwyth SY23 3BZ, Dyfed, Wales
[4] Max Planck Gesell, Dept Interface Sci, Fritz Haber Inst, D-14195 Berlin, Germany
[5] Synchrotron Light Res Inst, Nakhon Ratchasima 30000, Thailand
[6] Australian Synchrotron, Clayton, Vic 3168, Australia
[7] Aarhus Univ, Dept Phys & Astron, DK-8000 Aarhus C, Denmark
[8] Univ Oslo UiO, Dept Phys, Semicond Phys, NO-0371 Oslo, Norway
来源
JOURNAL OF PHYSICAL CHEMISTRY C | 2021年 / 125卷 / 07期
关键词
Graphene;
D O I
10.1021/acs.jpcc.0c10870
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The industrial realization of graphene has so far been limited by challenges related to the quality, reproducibility, and high process temperatures required to manufacture graphene on suitable substrates. We demonstrate that epitaxial graphene can be grown on transition-metal-treated 6H-SiC(0001) surfaces, with an onset of graphitization starting around 450-500 degrees C. From the chemical reaction between SiC and thin films of Fe or Ru, sp(3) carbon is liberated from the SiC crystal and converted to sp(2) carbon at the surface. The quality of the graphene is demonstrated by using angle-resolved photoemission spectroscopy and low-energy electron diffraction. Furthermore, the orientation and placement of the graphene layers relative to the SiC substrate are verified by using angle-resolved absorption spectroscopy and energy-dependent photoelectron spectroscopy, respectively. With subsequent thermal treatments to higher temperatures, a steerable diffusion of the metal layers into the bulk SiC is achieved. The result is graphene supported on magnetic silicide or optionally, directly on semiconductor, at temperatures ideal for further large-scale processing into graphene-based device structures.
引用
收藏
页码:4243 / 4252
页数:10
相关论文
共 50 条
  • [1] Low-temperature growth of nanocrystalline graphene on metal thin films
    Shin, Keun Wook
    Lee, Chang-Seok
    Lee, Eun-Kyu
    Yang, Eunji
    Lee, Hyangsook
    Kwon, Junyoung
    Byun, Kyung-Eun
    MATERIALS CHEMISTRY AND PHYSICS, 2024, 318
  • [2] In Situ Characterization of Alloy Catalysts for Low-Temperature Graphene Growth
    Weatherup, Robert S.
    Bayer, Bernhard C.
    Blume, Raoul
    Ducati, Caterina
    Baehtz, Carsten
    Schloegl, Robert
    Hofmann, Stephan
    NANO LETTERS, 2011, 11 (10) : 4154 - 4160
  • [3] Low-temperature synthesis of graphene
    V. P. Novikov
    S. A. Kirik
    Technical Physics Letters, 2011, 37 : 565 - 567
  • [4] Low-Temperature Synthesis of Graphene
    Novikov, V. P.
    Kirik, S. A.
    TECHNICAL PHYSICS LETTERS, 2011, 37 (06) : 565 - 567
  • [5] LOW-TEMPERATURE SEMICONDUCTOR RESISTANCE THERMOMETER
    LOGVINENKO, SP
    ROSSOSHANSKII, OA
    OPRISHCHENKO, LA
    MEASUREMENT TECHNIQUES USSR, 1988, 31 (11): : 1110 - 1112
  • [6] ON LOW-TEMPERATURE STUDIES OF SEMICONDUCTOR SURFACES
    GRAZHULIS, VA
    SURFACE SCIENCE, 1994, 299 (1-3) : 1022 - 1030
  • [7] Low-temperature semiconductor mechanical sensors
    Maryamova, I
    Druzhinin, A
    Lavitska, E
    Gortynska, I
    Yatzuk, Y
    SENSORS AND ACTUATORS A-PHYSICAL, 2000, 85 (1-3) : 153 - 157
  • [8] LOW-TEMPERATURE STUDIES OF SEMICONDUCTOR SURFACES
    GRAZHULIS, VA
    PROGRESS IN SURFACE SCIENCE, 1991, 36 (02) : 89 - 175
  • [9] LOW-TEMPERATURE MOBILITY IN A COMPENSATED SEMICONDUCTOR
    DZHAKELI, VG
    KACHLISHVILI, ZS
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1983, 17 (04): : 364 - 366
  • [10] LOW-TEMPERATURE METER WITH SEMICONDUCTOR TRANSDUCERS
    LOGVINEN.SP
    BEVZA, YG
    MEASUREMENT TECHNIQUES-USSR, 1967, (01): : 56 - &