Irradiation tests of double-sided silicon strip detectors with a special guard ring structure

被引:0
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作者
Abt, I [1 ]
Andricek, L [1 ]
Bauer, C [1 ]
Baumann, I [1 ]
Fox, H [1 ]
Halley, A [1 ]
Knopfle, KT [1 ]
Kroha, H [1 ]
Richter, RH [1 ]
Riechmann, K [1 ]
Rietz, M [1 ]
Rubsam, R [1 ]
Seywerd, H [1 ]
StDenis, R [1 ]
机构
[1] MAX PLANCK INST PHYS & ASTROPHYS,D-80805 MUNICH,GERMANY
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:28 / 32
页数:5
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