A simplified method of generating thermal models for power MOSFETs

被引:19
|
作者
Pandya, KI [1 ]
McDaniel, W [1 ]
机构
[1] Vishay Siliconix, Santa Clara, CA 95054 USA
关键词
D O I
10.1109/STHERM.2002.991350
中图分类号
O414.1 [热力学];
学科分类号
摘要
There is an increasing need for designers to understand the thermal performance of the semiconductors they use because end-product case sizes are shrinking while products' power levels remain the same or increase. A simulation tool such as P-SPICE is the most commonly available tool for engineers to use in performing thermal analysis of semiconductors. However, generating the thermal model for power semiconductors represents a major hurdle in performing such an analysis. A simplified method of model generation is needed. In this paper an Excel spreadsheet uses datasheet information published by the manufacturer to generate the R-C (resistance-capacitance) parameters for a thermal model. Implementation of the model in P-SPICE enables performance evaluation for any pre-defined operating condition. The intent is to arrive at a fair estimate of the junction temperature of the power-handling device, the MOSFET under transient high-power pulse/s. The explanation of a proposed simplified method of thermal model generation will include an example featuring a power MOSFET.
引用
收藏
页码:83 / 87
页数:5
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