SnO2 lithographic processing for nanopatterned gas sensors

被引:18
|
作者
Candeloro, P
Comini, E
Baratto, C
Faglia, G
Sberveglieri, G
Kumar, R
Carpentiero, A
Di Fabrizio, E
机构
[1] Univ Brescia, Dipartimento Chim & Fis Mat, I-25133 Brescia, Italy
[2] Univ Brescia, INFM, I-25133 Brescia, Italy
[3] LILIT Beamline, TASC, INFM, I-34012 Basovizza, TS, Italy
来源
关键词
D O I
10.1116/1.2110371
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Tin dioxide (SnO2) is widely used as sensing material in metal-oxides gas sensors. In this work we present two lithographic approaches for SnO2 patterning, an additive process and a subtractive one. In the first case patterns of SnO2 nanowires are successfully fabricated and exploited as sensing element in working devices, responses to several testing gases are satisfactorily improved with respect to continuous film devices. Regarding the subtractive process, we present reactive ion etching of SnO2 based on CF4/H-2 gas mixture. Dependence of etch rate upon H-2 concentration and effects due to Ar additions to plasma are investigated: results are discussed and a possible etching reaction is proposed, but further developments are required to increase the etch rate. (c) 2005 American Vacuum Society.
引用
收藏
页码:2784 / 2788
页数:5
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