Quench Protection Characteristics of Coil Wound of Bi/Ag-Sheathed Wire

被引：2
|
作者：
Tsukamoto, O. [1 ]
Fujimoto, Y. [2 ]
Yamaguchi, T. [3 ]
Ueno, E. [3 ]
Kato, T. [3 ]
Takao, T. [1 ]
Sasaki, E. [1 ]
Anazawa, T. [1 ]
机构：
[1] Sofia Univ, Tokyo 1028554, Japan
[2] Yokohama Natl Univ, Kanagawa 2408501, Japan
[3] Sumitomo Elect Ind, Osaka 5540024, Japan
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2015年 / 25卷 / 03期
基金：
日本科学技术振兴机构;
关键词：
Coil wound of Bi/Ag-sheathed wire; quench experiment; quench origins; quench protection;
D O I：
10.1109/TASC.2014.2367731
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The most probable cause of quenches of a coil wound of Bi/Ag-sheathed wires is the appearance of a long resistive zone caused by the temperature rise of the long part of the conductor due to, for example, ac losses and the malfunction of the cryogenic system. Protection characteristics of quenches by this cause are experimentally and analytically investigated. In the experiment, the operating temperature of a coil wound of a Bi/Ag-sheathed wire is gradually increased until the resistive voltage of the coil exceeds a given threshold to start a quench dump sequence. Damages in the test coils are examined by changing the decay time constant of the coil current. Based on those results, conditions to protect coils from damages are investigated. Analysis is conducted to simulate quench events, and conditions for quench protection are obtained. The analytical results well explain the quench behaviors of the test coils.
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页数：4
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