Nanometer scale science and technology -: The impact of STM and AFM

被引:0
|
作者
Hegner, M [1 ]
Güntherodt, HJ [1 ]
机构
[1] Univ Basel, Natl Ctr Competence Res Nanoscale Sci, Dept Phys & Astron, CH-4056 Basel, Switzerland
来源
关键词
D O I
暂无
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:11 / 31
页数:21
相关论文
共 50 条
  • [31] FIELD-INDUCED NANOMETER-SCALE TO ATOMIC-SCALE MANIPULATION OF SILICON SURFACES WITH THE STM
    LYO, IW
    AVOURIS, P
    SCIENCE, 1991, 253 (5016) : 173 - 176
  • [32] AFM image based pattern detection for adaptive drift compensation and positioning at the nanometer scale
    Belikov, Sergey
    Shi, Jian
    Su, Chanmin
    2008 AMERICAN CONTROL CONFERENCE, VOLS 1-12, 2008, : 2046 - 2051
  • [33] Evaluation of mechanical properties in nanometer scale using AFM-based nanoindentation tester
    Natl. Research Institute for Metals, 1-2-1 Sengen, Ibaraki 305-0047, Japan
    Nanostruct Mater, 5 (1049-1052):
  • [34] A new AFM-based tool for testing dielectric quality and reliability on a nanometer scale
    Olbrich, A
    Ebersberger, B
    Boit, C
    Vancea, J
    Hoffmann, H
    MICROELECTRONICS RELIABILITY, 1999, 39 (6-7) : 941 - 946
  • [35] Evaluation of mechanical properties in nanometer scale using AFM-based nanoindentation tester
    Miyahara, K
    Nagashima, N
    Ohmura, T
    Matsuoka, S
    NANOSTRUCTURED MATERIALS, 1999, 12 (5-8): : 1049 - 1052
  • [36] Nanometer-scale ordering in cast films of columnar metallomesogen as revealed by STM observations
    Kakegawa, N
    Hoshino, N
    Matsuoka, Y
    Wakabayashi, N
    Nishimura, SI
    Yamagishi, A
    CHEMICAL COMMUNICATIONS, 2005, (18) : 2375 - 2377
  • [37] Microelectronics and nanometer structures - Processing, measurement, and phenomena - Papers from the 4th International Conference on Nanometer-Scale Science and Technology - Preface
    Pang, SJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (04): : 1294 - 1294
  • [38] Morphological analysis of stainless steel scale like surface morphology using STM and AFM
    Vignal, V
    Roux, JC
    Olive, JM
    Desjardins, D
    Genton, V
    ACTA MATERIALIA, 1998, 46 (01) : 149 - 157
  • [39] STM AND AFM IN ELECTROCHEMISTRY .3. EXPANSION OF STM STUDIES
    FUJISHIMA, A
    DENKI KAGAKU, 1992, 60 (11): : 959 - 963
  • [40] The impact of science and technology
    Coleman, MJ
    TAPPI JOURNAL, 1999, 82 (01): : 10 - 10