Comparability of anterior chamber depth measurements with partial coherence interferometry and optical low-coherence reflectometry in pseudophakic eyes

被引:6
|
作者
Luft, Nikolaus [1 ]
Hirnschall, Nino [1 ]
Farrokhi, Sanaz [1 ]
Findl, Oliver [1 ,2 ]
机构
[1] Hanusch Hosp, A Karl Landsteiner Inst, Vienna Inst Res Ocular Surg, A-1140 Vienna, Austria
[2] Moorfields Eye Hosp NHS Fdn Trust, London, England
来源
关键词
INTRAOCULAR-LENS POWER; CATARACT-SURGERY; PRECISION BIOMETRY; POSITION; TOMOGRAPHY; AGREEMENT; MOVEMENT; ACMASTER; SEGMENT; DESIGN;
D O I
10.1016/j.jcrs.2015.08.013
中图分类号
R77 [眼科学];
学科分类号
100212 ;
摘要
PURPOSE: To assess whether anterior chamber depth (ACD) measurements in pseudophakic eyes. obtained with partial coherence interferometry (PCI) and optical low-coherence reflectometry (OLCR) devices can be used interchangeably. SETTING: Vienna Institute for Research in Ocular Surgery, A Karl Landsteiner Institute, Hanusch Hospital, Vienna, Austria. DESIGN: Prospective case series. METHODS: The ACD measurements in 1 eye of each pseudophakic patient were performed with the PCI-based ACMaster device and the OLCR-based Lenstar LS900 device at least 1 day postoperatively. RESULTS: The study comprised 65 eyes of 65 patients with a mean age of 71.7 years +/- 9.0 (SD) (range 39 to 91 years). In 15 eyes, no valid ACD readings could be obtained with the OLCR device. No obvious reason for these measurement failures was identified; however, tear-film alterations shortly after surgery were suspected. No significant difference in the mean ACD in the remaining 50 eyes was found between PCI measurements (5019 +/- 660 mu m; range 4008 to 6181 mu m) and OLCR measurements (5015 +/- 663 mu m; range 4017 to 6163 mu m) (P = .06). Three (6%) of 50 measurements were not within the 95% limits of agreement in the Bland-Altman analysis. CONCLUSIONS: Pseudophakic ACD measurements with the PCI and OLCR devices can be used interchangeably. The OLCR device proved to be more user-friendly and faster; however, in a substantial number of eyes, no usable values were obtainable. (C) 2015 ASCRS and ESCRS
引用
收藏
页码:1678 / 1684
页数:7
相关论文
共 50 条
  • [21] Comparison of an optical low-coherence interferometry and a Scheimpflug imaging combined with partial coherence interferometry biometers in cataract patients
    Han, Eui S.
    Kim, Moonjung
    [J]. CLINICAL AND EXPERIMENTAL OPHTHALMOLOGY, 2019, 47 : 85 - 85
  • [22] Agreement and relationship between ultrasonic and partial coherence interferometry measurements of axial length and anterior chamber depth
    Wissa, Amany R.
    Wahba, Sherein S.
    Roshdy, Maged M.
    [J]. CLINICAL OPHTHALMOLOGY, 2012, 6 : 193 - 198
  • [23] High precision biometry of pseudophakic eyes using partial coherence interferometry
    Findl, O
    Drexler, W
    Menapace, R
    Hitzenberger, CK
    Fercher, AF
    [J]. JOURNAL OF CATARACT AND REFRACTIVE SURGERY, 1998, 24 (08): : 1087 - 1093
  • [24] Low-coherence optical fibre speckle interferometry
    Balboa, I.
    D Ford, H.
    Tatam, R. P.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2006, 17 (04) : 605 - 616
  • [25] Comparison of anterior ocular biometry between optical low-coherence reflectometry and anterior segment optical coherence tomography in an adult Chinese population
    Shen, Peiyang
    Ding, Xiaohu
    Congdon, Nathan G.
    Zheng, Yingfeng
    He, Mingguang
    [J]. JOURNAL OF CATARACT AND REFRACTIVE SURGERY, 2012, 38 (06): : 966 - 970
  • [27] BRAGG GRATING CHARACTERIZATION BY OPTICAL LOW-COHERENCE REFLECTOMETRY
    LAMBELET, P
    FONJALLAZ, PY
    LIMBERGER, HG
    SALATHE, RP
    ZIMMER, C
    GILGEN, HH
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1993, 5 (05) : 565 - 567
  • [28] The Effect of Cycloplegia on the Biometer for Optical Low-coherence Reflectometry
    Yakar, Konuralp
    [J]. KLINISCHE MONATSBLATTER FUR AUGENHEILKUNDE, 2023,
  • [29] MULTIPLEXED SENSING USING OPTICAL LOW-COHERENCE REFLECTOMETRY
    SORIN, WV
    BANEY, DM
    [J]. IEEE PHOTONICS TECHNOLOGY LETTERS, 1995, 7 (08) : 917 - 919
  • [30] Multilayer optical storage using low-coherence reflectometry
    Massachusetts Inst of Technology, Lexington, United States
    [J]. Conf Proc Laser Electr Optic Soc Annu Meet, (101-102):