Fault coverage improvement based on error signal analysis

被引：0
|
作者：
Wong, MWT
Zhou, YQ
Lee, YS
Min, YH
机构：
来源：
PROCEEDINGS OF THE ASP-DAC '97 - ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE 1997 | 1996年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Fault-tolerant design of analog circuits is more difficult than that of digital circuits. Abhijit Chatterjee has proposed a continuous checksum-based technique to design fault-tolerant linear analog circuits. However, some faults in the passive elements cannot be detected if the checker has not been designed appropriately. This paper addresses the fault coverage issue in the continuous checksum based technique and proposes an error signal analysis based method for improving fault coverage of the checker.
引用
收藏
页码：409 / 412
页数：4
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