Areal-Density Capability Measurement Based on 747 Test in Magnetic Recording Systems

被引：1
|
作者：
Chen, Xinyi [1 ]
Huo, Xing [1 ]
机构：
[1] Western Digital Corp, Irvine, CA 92612 USA
来源：
IEEE TRANSACTIONS ON MAGNETICS | 2018年 / 54卷 / 05期
关键词：
747; test; areal-density (AD) capability; bit aspect ratio; off-track capability (OTC); perpendicular magnetic recording; ASPECT RATIO; SKEW ANGLE; HEADS; MODEL;
D O I：
10.1109/TMAG.2018.2799562
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A method is presented for determining the areal density (AD) capability of a magnetic recording system based on a set of 747 tests taken over a range of linear densities. By fitting the measured results with a suitable functional form, we can readily predict off-track capability (OTC) at any combination of linear density and track density. Conversely, for a given OTC requirement, we can immediately find the maximum AD that can be reached and the bit aspect ratio required to achieve it. Our results also reveal the effect of skew angle on AD and match well with previous results for perpendicular magnetic recording.
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页数：5
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