Effects of high-k dielectric environment on the full ballistic transport properties of monolayer MoS2 FETs

被引:12
|
作者
Song, Xian-Jiang [1 ]
Xu, Li-Chun [1 ]
Bai, Hui-Fang [1 ]
Li, Ying [1 ]
Ma, Zhiyuan [1 ]
Yang, Zhi [1 ]
Liu, Ruiping [1 ]
Li, Xiuyan [1 ]
机构
[1] Taiyuan Univ Technol, Coll Phys & Optoelect, Taiyuan 030024, Peoples R China
基金
中国国家自然科学基金;
关键词
FIELD-EFFECT TRANSISTORS; 2-DIMENSIONAL MATERIALS; LAYER;
D O I
10.1063/1.4980171
中图分类号
O59 [应用物理学];
学科分类号
摘要
High-k dielectric materials are indispensable as gate layers for micro-and nano-electronic devices. Using first-principles calculations and non-equilibrium Green's function simulations, we studied the electrical transport characteristics of p-type and n-type monolayer MoS2 field effect transistors (FETs) under various gate dielectric environments. We found that the intrinsic dielectric property of the gate insulator played an important role in the transport performance of nanodevices. For both types of MoS2 FETs, a high-k gate insulator enhances the current on/off ratio and reduces the subthreshold swing by properly shifting the valence (p-type) or conduction (n-type) bands around the bias energy window, which has benefits for the design of MoS2-based short-channel nanodevices in the future. Published by AIP Publishing.
引用
收藏
页数:5
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