Lateral grain size effect on exchange bias in polycrystalline NiFe/FeMn bilayer films

被引:9
|
作者
Hsu, Jen-Hwa [1 ]
Sun, An-Cheng [2 ]
Sharma, Puneet [3 ]
机构
[1] Natl Taiwan Univ, Dept Phys, Taipei 106, Taiwan
[2] Yuan Ze Univ, Dept Chem Engn & Mat Sci, Chungli 32003, Taiwan
[3] Thapar Univ, Sch Phys & Mat Sci, Patiala 147004, Punjab, India
关键词
Exchange bias; Interfacial grain size; Thin films; COUPLING FIELD; ANISOTROPY; MODEL;
D O I
10.1016/j.tsf.2013.06.065
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This study explores the effect of lateral grain size on the exchange bias in the magnetron sputtered NiFe(5 nm)/FeMn(20 nm) bilayer films. The thicknesses of ferromagnetic (NiFe) and antiferromagntic (FeMn) layers were kept constant in the study. The lateral grain size variation was induced by increasing Ta buffer layer thickness. The cross-sectional transmission electron microscopy revealed that bilayers deposited on thicker Ta buffer layers have larger lateral grain diameter. Grain-to-grain epitaxy from buffer layer controls lateral grain size at NiFe/FeMn interface. A large increase in exchange bias field was observed with increasing thickness of Ta buffer layer, which is attributed to the enhanced ferromagnetic/antiferromagnetic coupling originated from larger interface lateral grain area. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:87 / 90
页数:4
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