Lateral grain size effect on exchange bias in polycrystalline NiFe/FeMn bilayer films

被引:9
|
作者
Hsu, Jen-Hwa [1 ]
Sun, An-Cheng [2 ]
Sharma, Puneet [3 ]
机构
[1] Natl Taiwan Univ, Dept Phys, Taipei 106, Taiwan
[2] Yuan Ze Univ, Dept Chem Engn & Mat Sci, Chungli 32003, Taiwan
[3] Thapar Univ, Sch Phys & Mat Sci, Patiala 147004, Punjab, India
关键词
Exchange bias; Interfacial grain size; Thin films; COUPLING FIELD; ANISOTROPY; MODEL;
D O I
10.1016/j.tsf.2013.06.065
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This study explores the effect of lateral grain size on the exchange bias in the magnetron sputtered NiFe(5 nm)/FeMn(20 nm) bilayer films. The thicknesses of ferromagnetic (NiFe) and antiferromagntic (FeMn) layers were kept constant in the study. The lateral grain size variation was induced by increasing Ta buffer layer thickness. The cross-sectional transmission electron microscopy revealed that bilayers deposited on thicker Ta buffer layers have larger lateral grain diameter. Grain-to-grain epitaxy from buffer layer controls lateral grain size at NiFe/FeMn interface. A large increase in exchange bias field was observed with increasing thickness of Ta buffer layer, which is attributed to the enhanced ferromagnetic/antiferromagnetic coupling originated from larger interface lateral grain area. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:87 / 90
页数:4
相关论文
共 50 条
  • [1] Asymmetric recovery effect of exchange bias in polycrystalline NiFe/FeMn bilayers
    Qiu, X. P.
    Shi, Z.
    Zhou, S. M.
    Du, J.
    Bai, X. J.
    Chantrell, R.
    Sun, L.
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (06)
  • [2] Asymmetric exchange bias in NiFe/FeMn/NiFe multilayer films
    Lee, Young-Woo
    Hong, Seongmin
    Kim, CheolGi
    Kim, Chong-Oh
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2004, 272 : E943 - E944
  • [3] Anisotropy Effect of Exchange Bias Coupling by Unidirectional Deposition Field of NiFe/FeMn Bilayer
    Park, Young-Seok
    Hwang, Do-Guwn
    Lee, Sang-Suk
    JOURNAL OF THE KOREAN MAGNETICS SOCIETY, 2008, 18 (05): : 180 - 184
  • [4] Torque approach for tuning exchange bias training effect in polycrystalline NiFe/FeMn bilayers
    Shi, Z.
    Du, J.
    Chantrell, R. W.
    Mangin, S.
    Zhou, S. M.
    APPLIED PHYSICS LETTERS, 2011, 98 (12)
  • [5] Rotation of the pinning direction in the exchange bias training effect in polycrystalline NiFe/FeMn bilayers
    Qiu, X. P.
    Yang, D. Z.
    Zhou, S. M.
    Chantrell, R.
    O'Grady, K.
    Nowak, U.
    Du, J.
    Bai, X. J.
    Sun, L.
    PHYSICAL REVIEW LETTERS, 2008, 101 (14)
  • [6] Exchange bias in NiFe/FeMn/NiFe trilayers
    Kim, C.G. (cgkim@cnu.ac.kr), 1600, American Institute of Physics Inc. (96):
  • [7] Exchange bias in NiFe/FeMn/NiFe trilayers
    Sankaranarayanan, VK
    Yoon, SM
    Kim, DY
    Kim, CO
    Kim, CG
    JOURNAL OF APPLIED PHYSICS, 2004, 96 (12) : 7428 - 7434
  • [8] Effect of texture and interfacial roughness on the exchange bias field of NiFe/FeMn films
    Li, Ming-Hua
    Yu, Guang-Hua
    Zhu, Feng-Wu
    Jiang, Hong-Wei
    Lai, Wu-Yan
    2002, Journal of Functional Materials (33):
  • [9] Effect of interface roughness on the exchange bias for NiFe/FeMn
    Liu, CX
    Yu, CT
    Jiang, HM
    Shen, LY
    Alexander, C
    Mankey, GJ
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) : 6644 - 6646
  • [10] Effect of interface roughness on the exchange bias for NiFe/FeMn
    Liu, Congxiao
    Yu, Chengtao
    Jiang, Huaming
    Shen, Liyong
    Alexander, C.
    Mankey, G.J.
    1600, Am Inst Phys, Woodbury, NY, USA (87):