Cycling-induced degradation of LiCoO2 thin-film cathodes at elevated temperature

被引:11
|
作者
Van Sluytman, JS
West, WC
Whitacre, JF
Alamgir, FM
Greenbaum, SG
机构
[1] CUNY Hunter Coll, Dept Phys & Astron, New York, NY 10021 USA
[2] CALTECH, Jet Prop Lab, Electrochem Technol Grp, Pasadena, CA 91109 USA
基金
美国国家卫生研究院;
关键词
LiCoO2 thin-film cell; elevated temperature cycling; X-ray diffraction; phase transitions;
D O I
10.1016/j.electacta.2005.08.032
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The cycle life of LiCoO2-based all solid-state thin-film cells has been studied at room temperature, and at elevated temperatures of 50, 100, and 150 degrees C. X-ray diffraction, as well as Raman analysis, has been used to complement the electrochemical data in examining structural and chemical changes. XRD and Raman spectroscopy data indicate that elevated temperature soaks of the thin-film batteries in the quiescent state causes no discernable changes in the LiCoO2 cathode layer. However, when the thin-film batteries are cycled at elevated temperatures, decreases in average grain size of the LiCoO2 film occur with dramatic concomitant charge and discharge capacity loss. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:3001 / 3007
页数:7
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