Advanced Length Metrology exploiting the Frequency Comb of a Femtosecond Laser

被引：0

作者：

Kim, Young-Jin ^{[1
]}

Jin, Jonghan ^{[1
]}

Kim, Yunseok ^{[1
]}

Hyun, Sangwon ^{[1
]}

Kim, Seung-Woo ^{[1
]}

机构：

[1] Korea Adv Inst Sci & Technol, Billionth Uncertainty Precis Engn Grp, Taejon 305701, South Korea

来源：

2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9 | 2008年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The frequency comb of a femtosecond laser is exploited as the wavelength ruler for length metrology. This permits absolute distances to be precisely measured with uncertainty directly traceable to the atomic clock of time standard. (C)2008 Optical Society of America

引用

页码：2227 / 2228

页数：2

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