Amorphous SiO:H thin film visible light emitting diode

被引:11
|
作者
Boonkosum, W
Kruangam, D
Ratwises, B
Sujaridchai, T
Panyakeow, S
Fujikake, S
Sakai, H
机构
[1] CHULALONGKORN UNIV, FAC ENGN, DEPT ELECT ENGN, BANGKOK 10330, THAILAND
[2] FUJI ELECT CORP LTD, RES & DEV, YOKOSUKA, KANAGAWA 24001, JAPAN
关键词
D O I
10.1016/0022-3093(96)00117-2
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Undoped hydrogenated amorphous silicon oxide (a-SIO:H) was applied to the luminescent i-layer in the p-i-n junction amorphous thin film visible light emitting diode (TFLED) for the first time. The brightness obtained from the a-SiO:H is low compared with the hydrogenated amorphous silicon carbide and silicon nitride. However, the TFLEDs having boron-doped highly conductive a-SiO:H and microcrystalline (mu-c) SIO:H as the p-layers have a higher brightness by a factor of 5 compared with those with conventional boron doped a-SiC:H as the p-layer.
引用
收藏
页码:1226 / 1229
页数:4
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