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Electrical characterization of organic solar cell materials based on scanning force microscopy

被引：41
|
作者：
Berger, Ruediger [1 ]
Domanski, Anna L. [1 ]
Weber, Stefan A. L. [1 ,2 ]
机构：
[1] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
[2] Univ Coll Dublin, Conway Inst Biomol & Biomed Res, Dublin 4, Ireland
来源：
EUROPEAN POLYMER JOURNAL | 2013年 / 49卷 / 08期
关键词：
Kelvin probe force microscopy; Conductive scanning force microscopy; Solar cell; Photo-current AFM; Time resolved EFM; Degradation; KELVIN PROBE FORCE; SURFACE PHOTOVOLTAGE; CONJUGATED POLYMER; MORPHOLOGY; HETEROJUNCTIONS; PHOTOGENERATION; NANOSTRUCTURE; TRANSPORT; NANOWIRES; TIPS;
D O I：
10.1016/j.eurpolymj.2013.03.005
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
The application of electrical modes in scanning probe microscopy helps to understand the electrical function of materials that are structured on the nanometer scale. Scanning force microscopes are routinely used for the investigation of surface topography. Here we accentuate the use of electrical modes that are unique for the correlation of structural and electric information on a nanometer scale. This is particularly important for analyzing organic solar cell materials. A special focus is given to experiments aiming at the investigation of light-induced processes which requires the integration of an additional light source into the scanning force microscope setup. Furthermore, we address future challenges for scanning force microscopy investigation of electrical properties of soft matter materials. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码：1907 / 1915
页数：9
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