RietveldToTensor: Program for Processing Powder X-Ray Diffraction Data under Variable Conditions

被引：66

作者：

Bubnova, R. S. ^{[1
]}

Firsova, V. A. ^{[1
]}

Volkov, S. N. ^{[1
]}

Filatov, S. K. ^{[2
]}

机构：

[1] Russian Acad Sci, Grebenshchikov Inst Silicate Chem, St Petersburg 199034, Russia

[2] St Petersburg State Univ, St Petersburg 199034, Russia

来源：

GLASS PHYSICS AND CHEMISTRY | 2018年 / 44卷 / 01期

基金：

俄罗斯基础研究基金会;

关键词：

Rietveld method; high-temperature X-ray powder diffraction; crystallographic software; THERMAL-EXPANSION TENSOR; ALGORITHM;

D O I：

10.1134/S1087659618010054

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The RietveldToTensor program is designed to study crystal lattice deformations using the Rietveld method from the X-ray powder diffraction data gathered under varying physical and chemical conditions. Using the program, it is possible to determine the tensor of thermal expansion, compressibility, or chemical deformations of the material. The program runs on the Microsoft Windows 7 and higher platforms.

引用

页码：33 / 40

页数：8

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