Evaluation of power supply noise in CMOS and low noise logic cells

被引:3
|
作者
Zhou, Junfeng [1 ]
Dehaene, Wim [1 ]
机构
[1] Katholieke Univ Leuven, ESAT MICAS, B-3001 Heverlee, Belgium
关键词
D O I
10.1109/APEMC.2008.4559799
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In digital designs, it becomes more and more important to reduce the supply current variations (di/dt noise) they induce in the supply lines. This is due to the fact that steep variations in supply current give rise to EM (Electro-Magnetic) radiation. In this paper, two new modified low-noise logic styles - Complementary-CBL, (C-CBL) and Enhanced-CSL (E-CSL) are presented in which the di/dt noise due to the switching is reduced greatly with respect to standard CMOS (SCMOS) circuits. Furthermore, a comparison with existing alternative low noise techniques shows that, for the same supply voltage and the same power consumption, the Enhanced-CSL circuits have smaller area, higher noise margins and smaller propagation delay.
引用
收藏
页码:12 / 15
页数:4
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