Special issue: Test, defect tolerance and reliability of nanoscale devices

被引：0
|
作者：
Agrawal, Vishwani D.
机构：
来源：
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2007年 / 23卷 / 2-3期
关键词：
D O I：
10.1007/s10836-007-0773-7
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：111 / 111
页数：1
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