Elucidation of photovoltage origin and charge transport in Cu2O heterojunctions for solar energy conversion

被引:22
|
作者
Cendula, Peter [1 ,2 ]
Mayer, Matthew T. [3 ,4 ]
Luo, Jingshan [3 ,5 ]
Gratzel, Michael [3 ]
机构
[1] Univ Zilina, Fac Elect Engn & Informat Technol, Inst Aurel Stodola, Kpt Nalepku 1390, Liptovsky Mikulas 03101, Slovakia
[2] Zurich Univ Appl Sci ZHAW, Inst Computat Phys, Wildbachstr 21, CH-8401 Winterthur, Switzerland
[3] Ecole Polytech Fed Lausanne, SB, ISIC, LPI, Stn 6, CH-1015 Lausanne, Switzerland
[4] Helmholtz Zentrum Berlin Mat & Energie, Hahn Meitner Pl 1, D-14109 Berlin, Germany
[5] Nankai Univ, Coll Elect Informat & Opt Engn, Inst Photoelect Thin Film Devices & Technol, 38 Tongyan Rd, Tianjin 300350, Peoples R China
来源
SUSTAINABLE ENERGY & FUELS | 2019年 / 3卷 / 10期
关键词
OPEN-CIRCUIT VOLTAGE; OXIDE BUFFER LAYER; PROTECTIVE LAYER; ATOMIC LAYER; TIN-OXIDE; PHOTOCATHODES; PERFORMANCE; INTERFACE; COMPOSITE; TIO2;
D O I
10.1039/c9se00385a
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Heterojunctions between p-type cuprous oxide (Cu2O) and suitable n-type layers stand out as some of the best performing and abundant oxide photoabsorbers currently available for the generation of hydrogen with photoelectrochemical cells or conversion of solar energy to electricity. In this contribution, we used drift-diffusion semiconductor modeling to investigate the mechanism governing the charge transport in TiO2/Ga2O3/Cu2O and TiO2/Al:ZnO/Cu2O heterojunctions. The simulated photovoltage 0.9 V for TiO2/Ga2O3/Cu2O agrees well with the measured value of 1.0 V and the governing mechanism is identified to be thermionic emission of electrons across the Ga2O3/TiO2 interface. By modeling an optimized increase in Ga2O3 donor concentration, a photovoltage improvement of only 0.1 V is achievable, whereas further optimizing the electron affinity of Ga2O3 may lead to more significant improvement approaching 0.7 V. The optimized electron affinity of Ga2O3 enabled a simulated photovoltage of 1.6 V, close to the theoretical limit for Cu2O with a 2.17 eV bandgap energy. Additionally, we find that simulations can reproduce the measured photovoltage of TiO2/Al:ZnO/Cu2O only when an interface recombination layer at the Al:ZnO/Cu2O interface is included in the model. Our findings enable detailed understanding of the charge transport mechanism in Cu2O heterojunctions and offer various design directions for further photovoltage improvement.
引用
收藏
页码:2633 / 2641
页数:9
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