Is negative capacitance FET a steep-slope logic switch?

被引:132
|
作者
Cao, Wei [1 ]
Banerjee, Kaustav [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
关键词
TRANSISTOR;
D O I
10.1038/s41467-019-13797-9
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Negative Capacitance field-effect-transistor has long been touted as a steep-slope logic switch. Here, the authors present a lucid formulation that reveals the intrinsic limitation of NC-FETs in achieving steep-slope switching characteristics and highlights their more practical role in saving the voltage losses in modern FETs. The negative-capacitance field-effect transistor(NC-FET) has attracted tremendous research efforts. However, the lack of a clear physical picture and design rule for this device has led to numerous invalid fabrications. In this work, we address this issue based on an unexpectedly concise and insightful analytical formulation of the minimum hysteresis-free subthreshold swing (SS), together with several important conclusions. Firstly, well-designed MOSFETs that have low trap density, low doping in the channel, and excellent electrostatic integrity, receive very limited benefit from NC in terms of achieving subthermionic SS. Secondly, quantum-capacitance is the limiting factor for NC-FETs to achieve hysteresis-free subthermionic SS, and FETs that can operate in the quantum-capacitance limit are desired platforms for NC-FET construction. Finally, a practical role of NC in FETs is to save the subthreshold and overdrive voltage losses. Our analysis and findings are intended to steer the NC-FET research in the right direction.
引用
收藏
页数:8
相关论文
共 50 条
  • [41] A steep-slope transistor based on abrupt electronic phase transition
    Nikhil Shukla
    Arun V. Thathachary
    Ashish Agrawal
    Hanjong Paik
    Ahmedullah Aziz
    Darrell G. Schlom
    Sumeet Kumar Gupta
    Roman Engel-Herbert
    Suman Datta
    Nature Communications, 6
  • [42] A steep-slope transistor based on abrupt electronic phase transition
    Shukla, Nikhil
    Thathachary, Arun V.
    Agrawal, Ashish
    Paik, Hanjong
    Aziz, Ahmedullah
    Schlom, Darrell G.
    Gupta, Sumeet Kumar
    Engel-Herbert, Roman
    Datta, Suman
    NATURE COMMUNICATIONS, 2015, 6
  • [43] Steep-subthreshold slope dual gate negative capacitance junction less FET with dead channel: TCAD approach for digital/RF applications
    Chaudhary, Shalini
    Dewan, Basudha
    Sahu, Chitrakant
    Yadav, Menka
    MICROELECTRONICS JOURNAL, 2022, 127
  • [44] Ambipolar steep-slope nanotransistors with Janus MoSSe/graphene heterostructures
    Zhang, Xinjiang
    Huang, Anping
    Xiao, Zhisong
    Wang, Mei
    Zhang, Jing
    Chu, Paul K.
    NANOTECHNOLOGY, 2023, 34 (01)
  • [45] Ferroelectric Nanogap-Based Steep-Slope Ambipolar Transistor
    Guan, Yaodong
    Guo, Zhe
    You, Long
    SMALL, 2022, 18 (48)
  • [46] Buoyant Turbulent Kinetic Energy Production in Steep-Slope Katabatic Flow
    Oldroyd, Holly J.
    Pardyjak, Eric R.
    Higgins, Chad W.
    Parlange, Marc B.
    BOUNDARY-LAYER METEOROLOGY, 2016, 161 (03) : 405 - 416
  • [47] Stability Analysis of Concrete Block Anchor on Steep-Slope Floating Breakwater
    Sujantoko
    Armono, Haryo Dwito
    Djatmiko, Eko Budi
    Putra, Risandi Dwirama
    FLUIDS, 2022, 7 (08)
  • [48] Flow characteristics of a tangential vortex intake with steep-slope tapering section
    Chan, S. N.
    Qiao, Q. S.
    WATER SUPPLY, 2022, 22 (06) : 5818 - 5832
  • [49] Two-Dimensional Cold Electron Transport for Steep-Slope Transistors
    Liu, Maomao
    Jaiswal, Hemendra Nath
    Shahi, Simran
    Wei, Sichen
    Fu, Yu
    Chang, Chaoran
    Chakravarty, Anindita
    Liu, Xiaochi
    Yang, Cheng
    Liu, Yanpeng
    Lee, Young Hee
    Perebeinos, Vasili
    Yao, Fei
    Li, Huamin
    ACS NANO, 2021, 15 (03) : 5762 - 5772
  • [50] Experimental Details of a Steep-Slope Ferroelectric InGaAs Tunnel-FET With High-Quality PZT and Modeling Insights in the Transient Polarization
    Verhulst, Anne S.
    Saeidi, Ali
    Stolichnov, Igor
    Alian, Alireza
    Iwai, Hiroshi
    Collaert, Nadine
    Ionescu, Adrian M.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2020, 67 (01) : 377 - 382