A Temperature- and Aging-Compensated RC Oscillator With ±1030-ppm Inaccuracy From-40 °C to 85 °C After Accelerated Aging for 500 h at 125 °C

被引：1

作者：

Park, Kyu-Sang ^{[1
]}

Pal, Nilanjan ^{[1
]}

Li, Yongxin ^{[1
]}

Xia, Ruhao ^{[1
]}

Wang, Tianyu ^{[1
]}

Abdelrahman, Ahmed ^{[1
]}

Hanumolu, Pavan Kumar ^{[1
]}

机构：

[1] Univ Illinois, Dept Elect & Comp Engn ECE, Urbana, IL 61801 USA

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2023年 / 58卷 / 12期

关键词：

AC current stress; activation energy; aging compensation; delta-sigma modulator (DSM); duty cycling; pulse density modulation; RC oscillator; temperature compensation; RELAXATION-OSCILLATOR; ELECTROMIGRATION; POLYSILICON;

D O I：

10.1109/JSSC.2023.3320709

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This article presents a temperature- and aging-compensated RC oscillator (TACO) in which the long-term drift of the main oscillator is compensated by periodically locking its frequency to that of the less-aged reference oscillator. To improve the long-term stability of the TACO, it employs techniques, such as the use of higher activation energy (E-a) resistors, switched dual RC branches to mitigate stress from dc-current-induced electro migration (EM), and duty cycling to slow down the aging rate of the reference oscillator. Using the proposed techniques, a prototype 100-MHz RC oscillator fabricated in a 65-nm CMOS process achieves an inaccuracy of +/- 1030 ppm from -40 degrees C to 85 degrees C after 500 h of accelerated aging at 125 degrees C, with 5.1-ps(rms) period jitter and a power efficiency of 1.4 mu W/MHz.

引用

页码：3459 / 3469

页数：11

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