A Temperature- and Aging-Compensated RC Oscillator With ±1030-ppm Inaccuracy From-40 °C to 85 °C After Accelerated Aging for 500 h at 125 °C

被引:1
|
作者
Park, Kyu-Sang [1 ]
Pal, Nilanjan [1 ]
Li, Yongxin [1 ]
Xia, Ruhao [1 ]
Wang, Tianyu [1 ]
Abdelrahman, Ahmed [1 ]
Hanumolu, Pavan Kumar [1 ]
机构
[1] Univ Illinois, Dept Elect & Comp Engn ECE, Urbana, IL 61801 USA
关键词
AC current stress; activation energy; aging compensation; delta-sigma modulator (DSM); duty cycling; pulse density modulation; RC oscillator; temperature compensation; RELAXATION-OSCILLATOR; ELECTROMIGRATION; POLYSILICON;
D O I
10.1109/JSSC.2023.3320709
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article presents a temperature- and aging-compensated RC oscillator (TACO) in which the long-term drift of the main oscillator is compensated by periodically locking its frequency to that of the less-aged reference oscillator. To improve the long-term stability of the TACO, it employs techniques, such as the use of higher activation energy (E-a) resistors, switched dual RC branches to mitigate stress from dc-current-induced electro migration (EM), and duty cycling to slow down the aging rate of the reference oscillator. Using the proposed techniques, a prototype 100-MHz RC oscillator fabricated in a 65-nm CMOS process achieves an inaccuracy of +/- 1030 ppm from -40 degrees C to 85 degrees C after 500 h of accelerated aging at 125 degrees C, with 5.1-ps(rms) period jitter and a power efficiency of 1.4 mu W/MHz.
引用
收藏
页码:3459 / 3469
页数:11
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