Three-Dimensional Shape Measuring Method Based on Dual-Frequency Digital Moire Fringe

被引:0
|
作者
Hu Hailing [1 ,3 ,5 ]
He Renji [1 ,3 ]
Chen Yang [1 ,3 ,5 ]
Zhang Peiqing [2 ,3 ,5 ]
Shen Xiang [2 ,3 ,4 ,5 ]
Da Shixun [2 ,3 ,5 ]
Song Baoan [1 ,3 ,5 ]
机构
[1] Ningbo Univ, Fac Elect Engn & Comp Sci, Ningbo 315211, Zhejiang, Peoples R China
[2] Ningbo Univ, Res Inst Adv Technol, Ningbo 315211, Zhejiang, Peoples R China
[3] Key Lab Photoelectr Detecting Mat & Devices Zhej, Ningbo 315211, Zhejiang, Peoples R China
[4] Ningbo Univ, Ningbo Inst Oceanog, Ningbo 315211, Zhejiang, Peoples R China
[5] Engn Res Ctr Adv Infrared Photoelect Mat & Device, Ningbo 315211, Zhejiang, Peoples R China
关键词
3D measurement; dual-frequency; digital Moire fringe; digital pi phase shift; FOURIER-TRANSFORM PROFILOMETRY; OBJECT;
D O I
10.3788/LOP222658
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A dual-frequency digital Moire measurement method (DFDM) is proposed for the three-dimensional (3D) shape measurement of an object. The high- and low-frequency fringes are modulated separately along orthogonal direction using different carrier frequencies before being projected onto the measured object. After collecting and demodulating the composite fringe, the digital pi phase shift is used to remove the DC component of the demodulated fringes, resulting in high-precision Moire fringes for calculating the wrapped phase. The unwrapping of the high-frequency wrapped phase is guided by the low-frequency phase to further realistically reconstruct the surface of the measured object. When compared with existing single-shot digital Moire profilometry, DFDM effectively removes the DC component of the fringe and calculates the phase more accurately.
引用
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页数:8
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