AN ONLINE TOOL FOR THERMAL-FIELD EMISSION CALCULATIONS FROM METAL AND SEMICONDUCTING EMITTERS

被引：0
|
作者：
Rinne, Mikael [1 ]
Carceles, Salvador Barranco [2 ]
Zadin, Veronika [1 ]
Mavalankar, Aquila [3 ]
Underwood, Ian [2 ]
Kyritsakis, Andreas [1 ]
机构：
[1] Univ Tartu, Inst Technol, Tartu, Estonia
[2] Univ Edinburgh, Sch Engn, Edinburgh, Midlothian, Scotland
[3] Adaptix Imaging Ltd, Oxford, England
来源：
2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC | 2023年
关键词：
Electron emission calculation; GETELEC; field emission data analysis; electron spectroscopy; computational tools;
D O I：
10.1109/IVNC57695.2023.10188950
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present an online calculation tool that aspires to become the standard method of the field emission community for calculating emission characteristics and analyzing current-voltage (I-V) measurements. Our model is applicable to both metal and semiconductor emitters, considering nanometric curvatures and thermal-field emission. Our tool is developed in the form of a web application (https://getelec.org), which can be used to easily calculate the current density, Nottingham heat, electron spectra, and analyze I-V data.
引用
收藏
页码：183 / 185
页数：3
相关论文
共 50 条
  • [21] Electron emission characteristics of metal/diamond field emitters
    Department of Electrical Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565, Japan
    Diamond Relat. Mat., 5-7 (889-892):
  • [22] CBE Thermal Comfort Tool: Online tool for thermal comfort calculations and visualizations
    Tartarini, Federico
    Schiavon, Stefano
    Cheung, Toby
    Hoyt, Tyler
    SOFTWAREX, 2020, 12 (12)
  • [23] Field emission from carbon nanotube emitters fabricated by the metal intermediation layer
    Jeong, Taewon
    Heo, Jungna
    Lee, Jeonghee
    Park, Sanghyun
    Jin, Yongwan
    Kim, J. M.
    Oh, Taesik
    Park, Chongwyun
    Yoo, Ji-Beom
    Gong, Byoungyun
    Lee, Naesung
    Yu, SeGi
    JOURNAL OF APPLIED PHYSICS, 2006, 100 (06)
  • [24] FIELD-EMISSION FROM A METAL COVERED WITH A SEMICONDUCTING LAYER - A MODEL CALCULATION
    KIEJNA, A
    NIEDERMANN, P
    FISCHER, O
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1990, 50 (03): : 331 - 338
  • [25] Low temperature refrigeration by using thermal-field electron emission in a coaxial cylindrical diode
    Wu, L.
    Ang, L. K.
    JOURNAL OF APPLIED PHYSICS, 2008, 104 (08)
  • [26] USE OF THE THERMAL-FIELD EMISSION CHARACTERISTICS FOR THE EVALUATION OF WORK FUNCTION AND ELECTRIC-FIELD STRENGTH IN FEM
    WYSOCKI, JK
    SURFACE SCIENCE, 1981, 104 (2-3) : 463 - 477
  • [27] A Comparative Study of Field Emission From Semiconducting and Metallic Single-Walled Carbon Nanotube Planar Emitters
    Kleshch, Victor I.
    Eremina, Valentina A.
    Serbun, Pavel
    Orekhov, Anton S.
    Luetzenkirchen-Hecht, Dirk
    Obraztsova, Elena D.
    Obraztsov, Alexander N.
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2018, 255 (01):
  • [28] Spatial dependence of the temperature profile along a carbon nanotube during thermal-field emission
    Tripathi, G.
    Ludwick, J.
    Cahay, M.
    Jensen, K. L.
    JOURNAL OF APPLIED PHYSICS, 2020, 128 (02)
  • [29] MEBES IV THERMAL-FIELD EMISSION TANDEM OPTICS FOR ELECTRON-BEAM LITHOGRAPHY
    GESLEY, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 2949 - 2954
  • [30] FIELD-EMISSION FROM SILICON EMITTERS
    JOHNSTON, R
    MILLER, AJ
    SURFACE SCIENCE, 1992, 266 (1-3) : 155 - 162
12345