AN ONLINE TOOL FOR THERMAL-FIELD EMISSION CALCULATIONS FROM METAL AND SEMICONDUCTING EMITTERS

被引：0
|
作者：
Rinne, Mikael [1 ]
Carceles, Salvador Barranco [2 ]
Zadin, Veronika [1 ]
Mavalankar, Aquila [3 ]
Underwood, Ian [2 ]
Kyritsakis, Andreas [1 ]
机构：
[1] Univ Tartu, Inst Technol, Tartu, Estonia
[2] Univ Edinburgh, Sch Engn, Edinburgh, Midlothian, Scotland
[3] Adaptix Imaging Ltd, Oxford, England
来源：
2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC | 2023年
关键词：
Electron emission calculation; GETELEC; field emission data analysis; electron spectroscopy; computational tools;
D O I：
10.1109/IVNC57695.2023.10188950
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present an online calculation tool that aspires to become the standard method of the field emission community for calculating emission characteristics and analyzing current-voltage (I-V) measurements. Our model is applicable to both metal and semiconductor emitters, considering nanometric curvatures and thermal-field emission. Our tool is developed in the form of a web application (https://getelec.org), which can be used to easily calculate the current density, Nottingham heat, electron spectra, and analyze I-V data.
引用
收藏
页码：183 / 185
页数：3
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