Transferable Deep Metric Learning for Clustering

被引:1
|
作者
Chehboune, Mohamed Alami [1 ,2 ]
Kaddah, Rim [2 ]
Read, Jesse [1 ]
机构
[1] Ecole Polytech, Dept Comp Sci, Palaiseau, France
[2] IRT SystemX, Palaiseau, France
关键词
Clustering; Transfer Learning; Metric Learning;
D O I
10.1007/978-3-031-30047-9_2
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Clustering in high dimension spaces is a difficult task; the usual distance metrics may no longer be appropriate under the curse of dimensionality. Indeed, the choice of the metric is crucial, and it is highly dependent on the dataset characteristics. However a single metric could be used to correctly perform clustering on multiple datasets of different domains. We propose to do so, providing a framework for learning a transferable metric. We show that we can learn a metric on a labelled dataset, then apply it to cluster a different dataset, using an embedding space that characterises a desired clustering in the generic sense. We learn and test such metrics on several datasets of variable complexity (synthetic, MNIST, SVHN, omniglot) and achieve results competitive with the state-of-the-art while using only a small number of labelled training datasets and shallow networks.
引用
收藏
页码:15 / 28
页数:14
相关论文
共 50 条
  • [21] Deep Factorized Metric Learning
    Wang, Chengkun
    Zheng, Wenzhao
    Li, Junlong
    Zhou, Jie
    Lu, Jiwen
    2023 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, CVPR, 2023, : 7672 - 7682
  • [22] Guided Deep Metric Learning
    Gonzalez-Zapata, Jorge
    Reyes-Amezcua, Ivan
    Flores-Araiza, Daniel
    Mendez-Ruiz, Mauricio
    Ochoa-Ruiz, Gilberto
    Mendez-Vazquez, Andres
    2022 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION WORKSHOPS, CVPRW 2022, 2022, : 1480 - 1488
  • [23] Deep Compositional Metric Learning
    Zheng, Wenzhao
    Wang, Chengkun
    Lu, Jiwen
    Zhou, Jie
    2021 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, CVPR 2021, 2021, : 9316 - 9325
  • [24] Introspective Deep Metric Learning
    Wang, Chengkun
    Zheng, Wenzhao
    Zhu, Zheng
    Zhou, Jie
    Lu, Jiwen
    IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2024, 46 (04) : 1964 - 1980
  • [25] Deep Transfer Metric Learning
    Hu, Junlin
    Lu, Jiwen
    Tan, Yap-Peng
    2015 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2015, : 325 - 333
  • [26] Deep Relational Metric Learning
    Zheng, Wenzhao
    Zhang, Borui
    Lu, Jiwen
    Zhou, Jie
    2021 IEEE/CVF INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV 2021), 2021, : 12045 - 12054
  • [27] Deep Adversarial Metric Learning
    Duan, Yueqi
    Zheng, Wenzhao
    Lin, Xudong
    Lu, Jiwen
    Zhou, Jie
    2018 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2018, : 2780 - 2789
  • [28] Deep Causal Metric Learning
    Deng, Xiang
    Zhang, Zhongfei
    INTERNATIONAL CONFERENCE ON MACHINE LEARNING, VOL 162, 2022,
  • [29] Deep Variational Metric Learning
    Lin, Xudong
    Duan, Yueqi
    Dong, Qiyuan
    Lu, Jiwen
    Zhou, Jie
    COMPUTER VISION - ECCV 2018, PT 15, 2018, 11219 : 714 - 729
  • [30] Deep Metric Learning: A Survey
    Kaya, Mahmut
    Bilge, Hasan Sakir
    SYMMETRY-BASEL, 2019, 11 (09):