Direct Observation of Atomic Arrangement in Multicomponent Calcium Ferrite Using Scanning Transmission Electron Microscopy

被引:0
|
作者
Takehara, Kenta [1 ]
Ikeda, Kohei [1 ]
Kawano, Takashi [1 ]
Higuchi, Takahide [1 ]
机构
[1] JFE Steel Corp, Steel Res Lab, 1 Kokan Cho, Fukuyama, Hiroshima 7218510, Japan
关键词
sintered ore; calcium ferrite; SFCA; scanning transmission electron microscopy; AENIGMATITE STRUCTURE-TYPE; CRYSTAL-STRUCTURE; SILICO-FERRITE; ALUMINUM SFCA; PHASES; QUANTIFICATION; REFINEMENT; CHEMISTRY; HOMOLOG;
D O I
10.2355/isijinternational.ISIJINT-2023-146
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
To reduce the reducing agent ratio and CO2 emissions in blast furnace operation, it is important to control the material structure of sintered ore, which affects its metallurgical and mechanical properties. Multicomponent calcium ferrites (also called CF or SFCA (silico-ferrite of calcium and aluminum)), which is a type of melting and solidification structure, has attracted considerable interest recently, and the chemical composition and crystal structure of each CF have been researched. Although the crystal structure of CF has conventionally been analyzed mainly by XRD, the atomic arrangement could not be observed directly. Therefore, in this study, CF was investigated at the atomic level by scanning transmission electron microscopy (STEM). This research revealed that acicular CF, which was previously understood to be SFCA-I, has a SFCA (not equal SFCA-I) structure. It was also found that columnar CF had a non-periodic SFCA structure induced with a magnetite-like structure. Furthermore, a CF in which SFCA and SFCA-I were alternately stacked repeatedly was also discovered. This research clarified the fact that CF has a non-periodic structure at the atomic level.
引用
收藏
页码:1567 / 1575
页数:9
相关论文
共 50 条
  • [21] Structure and bonding at the atomic scale by scanning transmission electron microscopy
    Muller, David A.
    NATURE MATERIALS, 2009, 8 (04) : 263 - 270
  • [22] DIRECT OBSERVATION OF VOIDS IN DOPED TUNGSTEN BY SCANNING ELECTRON MICROSCOPY
    DAS, G
    METALLURGICAL TRANSACTIONS, 1971, 2 (11): : 3239 - &
  • [23] ATOMIC-NUMBER CONTRAST USING SCANNING-TRANSMISSION ELECTRON-MICROSCOPY - USE FOR THE OBSERVATION OF UNSTAINED BIOLOGICAL SECTIONS
    CARLEMALM, E
    COLLIEX, C
    GARAVITO, M
    BIOLOGY OF THE CELL, 1982, 44 (01) : A2 - A2
  • [24] Microstructural examination of layered coatings by scanning electron microscopy, transmission electron microscopy, and atomic force microscopy
    Rickerby, DG
    Friesen, T
    MATERIALS CHARACTERIZATION, 1996, 36 (4-5) : 213 - 223
  • [25] Analysis of environmental particles by atomic force microscopy, scanning and transmission electron microscopy
    Mavrocordatos, D
    Pronk, W
    Boller, M
    WATER SCIENCE AND TECHNOLOGY, 2004, 50 (12) : 9 - 18
  • [26] Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
    Findlay, S. D.
    Shibata, N.
    Sawada, H.
    Okunishi, E.
    Kondo, Y.
    Yamamoto, T.
    Ikuhara, Y.
    APPLIED PHYSICS LETTERS, 2009, 95 (19)
  • [27] DIRECT OBSERVATION ON FERROELECTRIC FIELDS OF GLYCOCOL SULFATE CRYSTALS USING SCANNING ELECTRON MICROSCOPY
    LEBIHAN, R
    MAUSSION, M
    JOURNAL DE MICROSCOPIE, 1971, 11 (01): : 12 - +
  • [28] DIRECT OBSERVATION OF BATIO3 CRYSTALS USING SCANNING ELECTRON-MICROSCOPY
    LEBIHAM, R
    MAUSSION, M
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1972, 274 (18): : 1075 - &
  • [29] Atomic arrangement at ZnTe/CdSe interfaces determined by high resolution scanning transmission electron microscopy and atom probe tomography
    Bonef, Bastien
    Gerard, Lionel
    Rouviere, Jean-Luc
    Grenier, Adeline
    Jouneau, Pierre-Henri
    Bellet-Amalric, Edith
    Mariette, Henri
    Andre, Regis
    Bougerol, Catherine
    APPLIED PHYSICS LETTERS, 2015, 106 (05)
  • [30] Direct measurement of electrostatic potentials at the atomic scale: A conceptual comparison between electron holography and scanning transmission electron microscopy
    Winkler, Florian
    Barthel, Juri
    Dunin-Borkowski, Rafal E.
    Mueller-Caspary, Knut
    ULTRAMICROSCOPY, 2020, 210 (210)