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- [1] Electromigration behavior of Sn3.0Ag0.5Cu/Sn58Bi structural composite solder interconnect 2016 17TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2016, : 268 - 272
- [3] Microstructure and shear behavior of solder joint with Sn58Bi/Sn3.0Ag0.5Cu/Cu superposition structure Journal of Materials Science: Materials in Electronics, 2019, 30 : 14077 - 14084
- [6] Shear strength and fracture behavior of locally-melted hybrid Cu/Sn3.0Ag0.5Cu/Sn58Bi/Cu joints under different loading rates ICEPT2019: THE 2019 20TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, 2019,
- [7] Interfacial reactions and microstructural evolution of BGA structure Cu/Sn3.0Ag0.5Cu/Sn58Bi/Cu mixed assembly joints during isothermal aging 2016 17TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2016, : 968 - 973
- [9] Evolution of the Microstructure of Sn58Bi Solder Paste with Sn-3.0Ag-0.5Cu Addition During Isothermal Aging Journal of Electronic Materials, 2019, 48 : 1758 - 1765
- [10] Microstructure and properties of Sn1.0Ag0.5Cu and Sn3.0Ag0.5Cu lead-free solder Xiyou Jinshu, 7 (589-593):