Psychometric Properties of Positive and Negative Schedule Scale for Children-Short Form in Diverse American Adolescents

This study examined the psychometric properties of the Positive and Negative Affect Schedule for Children-Short Form (PANAS-C-SF) in a diverse sample of 15-year-olds in the United States [N = 4382]. Multiple measurement models, including a one-factor model, two-factor orthogonal and oblique models, a three-factor model (PA, Fear, and Distress), and a bifactor model, were tested. The results supported a three-factor structure, with distinct factors for PA, Fear, and Distress. The PANAS-C-SF scores evidenced good internal consistency reliability. Measurement invariance analyses indicated that the three-factor structure was invariant across gender and racial-ethnic groups, suggesting the generalizability of the PANAS-C-SF across diverse populations. Furthermore, the three factors demonstrated criterion validity, with PA positively associated with life satisfaction and meaning in life, and Distress negatively associated with these outcomes. These findings support the psychometric properties of the PANAS-C-SF, highlighting its practical utility in assessing affect across diverse adolescent population.