Thermal Characterization of Micrometric Polymeric Thin Films by Photoacoustic Spectroscopy

被引:1
|
作者
Fernandez-Olaya, Mareny Guadalupe [1 ]
Franco-Bacca, Adriana Paola [1 ]
Martinez-Torres, Pablo Genaro [2 ]
Ruiz-Gomez, Miguel Angel [3 ]
Meneses-Rodriguez, David [3 ]
Li Voti, Roberto [4 ]
Alvarado-Gil, Juan Jose [1 ]
机构
[1] CINVESTAV, Appl Phys Dept, Unidad Merida, Km 6 Antigua Carretera Progreso Apdo Postal 73, Merida 97310, Yucatan, Mexico
[2] Univ Michoacana, Inst Phys & Math, Edificio C-3,Cd Univ, Morelia 58040, Michoacan, Mexico
[3] CONACYT, Appl Phys Dept, Unidad Merida, CINVESTAV, Km 6 Antigua Carretera Progreso Apdo Postal 73, Merida 97310, Yucatan, Mexico
[4] Sapienza Univ Roma, Dipartimento Sci Base & Appl Ingn, Via Antonio Scarpa 16, I-00161 Rome, Italy
来源
关键词
photoacoustics; thin layers; volumetric heat capacities; THERMOPHYSICAL PROPERTIES; DIFFUSIVITY; CONDUCTIVITY;
D O I
10.1002/pssr.202300057
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In materials science, the knowledge of the thermal properties of thin films on thick substrates is crucial in determining the role of the film in the physical properties of the entire system. Even though the role of the film can be very important, the determination of its thermal properties is a challenging task due to the fact that its contribution to heat transfer is generally hard to single out from the influence of the substrate. Herein, a simple analytical methodology, based on the photoacoustic technique, useful in the thermal characterization of thin films on thick substrates, is presented. The approach is based on illuminating one side of the substrate with a modulated laser beam and monitoring the thermal contrast when a thin film is formed on the opposite side. This methodology allows to unambiguously determine the volumetric heat capacity of micrometric polymeric thin films. The limits of applicability of the method as well as the possibility of performing a full characterization of the thermal properties of the film are discussed.
引用
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页数:11
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