Analysis of X-ray images and spectra (aXis2000): A toolkit for the analysis of X-ray spectromicroscopy data

被引：25
|
作者：
Hitchcock, Adam P. [1 ]
机构：
[1] McMaster Univ, Chem & Chem Biol, Hamilton, ON, Canada
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2023年 / 266卷
基金：
加拿大自然科学与工程研究理事会;
关键词：
Spectromicroscopy data analysis package; AXis2000; STXM; Chemical mapping; Polarization mapping; FLUORESCENCE; TOMOGRAPHY; MICROSCOPY; ORIENTATION; AEROGELS; STXM;
D O I：
10.1016/j.elspec.2023.147360
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Spectromicroscopy refers to analytical methods that combine imaging and spectroscopy to provide detailed, spatially resolved analytical information about a sample, such as the type and quantitative spatial distributions of chemical components, geometric or magnetic alignment information, crystal structure, etc. The analysis of X-ray images and spectra (aXis2000) software described in this work provides a set of routines within a single, integrated, graphical-oriented package to read, display, manipulate and analyze spectromicroscopy data, with particular focus on soft X-ray spectromicroscopy methods such as scanning transmission X-ray microscopy (STXM), X-ray photoemission electron microscopy (XPEEM), scanning photoelectron X-ray microscopy (SPEM) and transmission X-ray microscopy (TXM). Here, this free software is described and compared to other software that can provide similar or complementary capabilities. Examples of spectromicroscopic analyses using advanced features of aXis2000 are provided.
引用
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页数：14
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