X-ray and electrical characterization of a multipixel diamond-based detector in high temperature environments

被引：0
|
作者：
Serpente, V. [1 ]
Mastellone, M. [1 ]
Girolami, M. [1 ]
Bellucci, A. [1 ]
Ranieri, A. [2 ]
Boothby, A. [3 ]
Walsh, S. [3 ]
Lefeuvre, G. [3 ]
Trucchi, D. M. [1 ]
机构：
[1] CNR, Ist Struttura Mat ISM, DiaTHEMA Lab, Via Salaria Km 29-300, I-00015 Monterotondo, Rome, Italy
[2] CNR, Ist Cristallog IC, Via Salaria Km 29-300, I-00015 Monterotondo, Rome, Italy
[3] Micron Semicond Ltd, Lancing Business Pk, Lancing BN15 8SJ, W Sussex, England
来源：
DIAMOND AND RELATED MATERIALS | 2023年 / 135卷
关键词：
Single-crystal diamond; X-ray detection; Thermal characterization; Electrical characterization;
D O I：
10.1016/j.diamond.2023.109819
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An 8-pixel X-ray diamond detector prototype, fabricated on an alumina substrate and specifically designed to operate at high temperature, has been developed and tested. Tungsten electrodes were developed as metal -semiconductor contact and showed an ohmic behavior, as inferred from current-voltage measurements. A 40 -cy-cles thermal stress test performed in helium atmosphere, in which temperature has been varied cyclically be-tween 100 and 240 degrees C, showed minor evolution of the detector dark current, presumably related to progressive water desorption from the alumina substrate. Conversely, X-ray photocurrent measurements showed no signif-icant differences before and after the thermal cycles, confirming no degradation of the stability of the prototype even after prolonged operation at high temperature.
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页数：6
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